This paper surveys econometric innovations related to differences-in-differences estimators and to event-study models with time-varying treatment effects. Our discussion highlights tricky ...
Abstract: T-coil circuit is capable of mitigating the influence of parasitic capacitance in ESD protection circuits, but the mutual induced voltage reduces ESD robustness. In this study, HBM, CDM, TLP ...
We investigate the origins and implications of zero-sum thinking: the belief that gains for one individual or group tend to come at the cost of others. Using a new survey of 20,400 U.S. residents, we ...
Abstract: An important development trend of ON-chip power clamp circuits is that they should be able to deal with more types of power rail overstress events, such as electrostatic discharges (ESDs) ...
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