Laser-induced single event effects (SEE) and two-photon absorption (TPA) constitute a dynamic area of research aimed at replicating and understanding the transient disruptions in microelectronic ...
The Defense Advanced Research Projects Agency (DARPA) will host a Proposers Day in support of the Broad Agency Announcement (BAA) HR001123S0047, Advanced Sources for Single-event Radiation Testing ...
Why GaN components are highly resistant to radiation damage, such as total ionizing dose (TID), making GaN well-suited for harsh space environments. Why GaN devices remain vulnerable to single-event ...
The effects of cosmic rays were once discussed in “Doubled-up MOSFETs“. The idea was that component redundancy, paired MOSFETs in that case, would allow one MOSFET to still function even if its ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results