A cryogen-free optical-coupled scanning probe microscope based on remote helium liquefaction has enabled months-long ...

For smartphones and computers to become smaller and faster, technologies capable of precisely controlling electrical ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

ORNL researcher David Cullen has been named a Fellow of the Microscopy Society of America for significant contributions to ...

Anyone who has ever taken the time to critically examine a walnut knows that a two-dimensional photograph fails in many respects to truly convey the unique features--the nicks, crannies, valleys, and ...

A review paper presents an integrated AFM framework for observing, manipulating, and engineering ferroelectric materials at ...

Atomic force microscopy (AFM) has evolved into an indispensable tool for nanoscale investigation, enabling detailed imaging and quantification of surface topography as well as mechanical properties.

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

The world of nanoscale analysis has been revolutionized by the advent of electrical Atomic Force Microscopy (AFM) modes. New possibilities for measuring electrical properties with remarkable precision ...

(Nanowerk News) Membrane rafts are nanometer-scale structures rich in cholesterol and sphingolipids, believed to serve as vital platforms for cell signaling, viral entry, and cancer metastasis. Since ...

Researchers at Nano Life Science Institute (WPI-NanoLSI), Kanazawa University report in Small Methods the 3D imaging of a suspended nanostructure. The technique used is an extension of atomic force ...